Led by Eric Stach, this meeting will involve a short presentation on Electron Microscopy, followed by working discussion about the pros and cons of these various approaches, selecting initial strategies for CHASE researchers to target, and nucleating team projects around … Read more
Led by Eric Stach, this meeting will involve a short presentation on Operando Characterization (TEM, XAS, XRD, XPS), followed by working discussion about the pros and cons of these various approaches, selecting initial strategies for CHASE researchers to target, and … Read more
The first 15 minutes features a brief tutorial on Si Etching and BHF Etch Safety led by Sam Bottum. This is followed by a presentation on UHV Characterization (XPS, UPS, IPES) led by Carrie Donley, followed by a working discussion. … Read more